Final Program. 63 rd IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS

Transcription

1 Final Program 63 rd IEEE HOLM CONFERENCE ON ELECTRICAL CONTACTS SEPTEMBER 2017 Brown Palace Hotel Denver CO, USA Sponsored By: The Electronics Packaging Society (formerly CPMT) of The Institute of Electrical and Electronics Engineers, Inc.

2 2017 HOLM Conference Officers CONFERENCE CHAIR Rod Martens, TE CONNECTIVITY CONFERENCE VICE CHAIR Xin Zhou, EATON CORPORATION FINANCE CHAIR Henry Czajkowski, ROCKWELL AUTOMATION TECHNICAL PROGRAM CHAIR Daniel Gagnon, HYDRO QUEBEC IREQ TECHNICAL PROGRAM VICE CHAIR Ronald Coutu, MARQUETTE UNIVERSITY CPMT TECHINCAL COMMITTEE 1 ELECTRICAL CONTACTS CHAIR Gerald Witter, ELECTRICAL CONTACTS PLUS, LLC CPMT TECHINCAL COMMITTEE 1 ELECTRICAL CONTACTS VICE CHAIR Robert Malucci, R.D. MALUCCI CONSULTING PUBLICITY CHAIR John J. Shea, SCHNEIDER ELECTRIC INTENSIVE COURSE DIRECTOR, and US REPRESENTATIVE for the INTERNATIONAL CONFERENCE Paul Slade, CONSULTANT 2017 HOLM Technical Program Committee TECHNICAL PROGRAM CHAIR Daniel Gagnon, HYDRO QUEBEC IREQ TECHNICAL PROGRAM VICE CHAIR Ronald Coutu, MARQUETTE UNIVERSITY Z.K. Chen, ELECTRICAL CONTACTS PLUS, LLC Bella Chudnovsky, BHC CONSULTING Henry Czajkowski, ROCKWELL AUTOMATION George Drew, DELPHI PACKARD ELECTRIC SYSTEMS George Flowers, AUBURN UNIVERSITY Hélène Gauthier, HYDRO QUEBEC IREQ Peter Hale, DERINGER NEY, INC. Guenther Horn, ELCONMAT CONSULTING ASSOCIATES Robert Jackson, AUBURN UNIVERSITY Chi Leung, CONSULTANT Rod Martens, TE CONNECTIVITY Richard Moore, C&K COMPONENTS Deepak Patil, MOLEX INC. Timo Muetzel, UMICORE AG & CO. KG Marjorie Myers, TE CONNECTIVITY Karumbu Meyyappan, INTEL Brett Rickett, MOLEX INC. John J. Shea, SCHNEIDER ELECTRIC Ed Smith III, DERINGER NEY, INC. David Williams, NEXTEER Gerald Witter, ELECTRICAL CONTACTS PLUS, LLC Guang Yang, MOLEX Xin Zhou, EATON CORPORATION

3 2017 Operating Committee Rod Martens, Chairman Xin Zhou, Vice Chairman Daniel Gagnon, Program Chairman Ronald Coutu, Program Vice Chairman Henry Czajkowski, Finance Chairman John Shea, Publicity Chairman John Shea, Webmaster Gerald Witter, TC-1 Chair Paul Slade, Course Director Z. K. Chen, Immediate Past Conference Chairman 2017 Awards Committee John McBride John Shea Roland Timsit 2017 Prize Paper Award Committee Robert Jackson David Williams Hélène Gauthier 1

4 ose To provide a forum for the presentation and discussion of the latest developments in the field of electrical contacts, as well as the application of recent advances in materials and processes in electrical, electronic and telecommunications equipment. For Whom Practicing designers, engineers, physicists, and research scientists those new to the field and those experienced. The 2017 IEEE Holm Conference will include excellent papers authored by outstanding technical people in this field. The international contributors come from A u s t r i a, B e l g i u m, China, France, Germany, India, Japan, Kazakhstan, Malaysia, Mexico, Switzerland, the United Kingdom, and the USA. These papers will provide the attendees with up-to-date information on a wide range of subjects that makes this conference so attractive to the practicing engineer. Additionally, the 2017 IEEE Holm Conference will make it possible for any attendee to discuss personally, with any author, additional details concerning the work presented by the author at the conference or any subject related to the authorʼs field of expertise. Background The Holm Conference began in 1953 as a forum for the discussion of electrical contact phenomena and related fields. In 1968, the conference was named the Holm Seminar in honor of Dr. Ragnar Holm, whose contributions to the field of electrical contacts spanned 50 years and forms the foundation of the electrical contacts field, was the inspiration and guide of the Conference from its inception until his death in In addition to the Annual Conference, the Conference Organization regularly conducts an intensive course on contacts and participates in the biannual International Conference on Electrical Contacts. 2

5 ration All participants are encouraged to pre-register to avoid lines at conference and to obtain the discounted fee. CONFERENCE REGISTRATION On/Before July 10 After July 10 IEEE Member US$800 US$875 Non Member US$875 US$950 Student/Life Member US$350 US$400 CONFERENCE REGISTRATION HOURS Sunday 9 September 4:00PM 6:00PM Monday 10 September Tuesday 11 September Wednesday 12 September 7:00AM 5:00PM 8:00AM 4:30PM 8:00AM 4:00PM Registration can be completed online: Registration payments: Checks are to be made out to the IEEE HOLM in US$. Visa, MasterCard, Discover, and American Express are accepted For additional information please contact Holm Registrar, at: US and Canada: Elsewhere: holmreg@ieee.org WELCOME RECEPTION All conference attendees are invited to register early and to attend our welcome reception on Sunday, 10 September from 4:00 PM 6:00 PM at the Ellyngtonʼs room of the Brown Palace Hotel. 3

6 Hotel Acco mmodations 63rd 63rd IEEE Holm Conference on on Electrical Contacts The The 2017 conference meets in in in Denver, Colorado at at the the Brown Brown Palace Hotel, where meeting facilities are are well well suited to to the the conference sessions and other activities. The The hotel hotel is is offering special rates of of of US$229* single/double occupancy to to conference attendees. Rates are are subject to to state state and and local local tax. tax. To To make a a reservation please use use the the Holm Conference link link or or call call the the Brown Palace Hotel Reservations , and and please refer to to to the the group name as as IEEE in in order order to to receive the the group rate. The rate is is is valid until until August th 2017 th 2017 at at 5:00PM MST. Reservations received after after this this date date will will be be subject to to space and availability. Attendees will will be be charged 1 1 nightʼs deposit at at at time of of of booking, which is is refundable in case in case of a of a cancellation as as long as as as you cancel your room before 6pm, 6pm, 3 days 3 days prior prior to to arrival. Check in in time: 3:00PM EST Check out out time: 12:00PM EST Brown Palace Hotel th St th th St Denver CO CO USA (303) Transportation Airport and and Driving Directions: FROM DENVER INTERNATIONAL AIRPORT to to MINUTES/22 MILES Exit Exit the the airport on on Pena Boulevard, drive miles miles to to I-70 I-70 west, west, continue on on I-70 I-70 west 77 7 miles to to to Colorado Boulevard (exit (exit 276B). Turn left left on on on Colorado Boulevard, drive drive south south on on Colorado Boulevard miles to to to 17th Avenue and and turn turn right. right. Drive west on on 17th Avenue miles. (Note: As As York York street street is is crossed, 17th Avenue becomes 18th Avenue). Continue heading west on on 18th Avenue to to to Tremont Street. Veer Veer left left on on Tremont Street. The front entrance of of The The Brown Palace Hotel Hotel will will be be on on the the left. left. Convenient Shuttle Service To To The The Airport: Super Shuttle provides transportation from from the the airport for for $25 $25 per per person one way and and $46 $46 round trip. trip. To To make make arrangements with Super Shuttle, call call BLUE-VAN. The The Brown Palace doorman can can assist you you in in hailing a cab. a cab. A A one-way taxi taxi ride to to to the the airport is is is approximately $57. $57. 4

7 DRIVING: If you are arriving by your own transportation, parking fees at the Brown Palace Hotel are $45 per night: For specific driving directions consult Map Quest at or call the hotel directly at +1 (303)

8 Social Event Conference Banquet Kevin Taylor s at the Opera House Monday, 11 September :30PM Located in the Chambers Grant Salon in the Ellie Caulkins Opera House at the Denver Performing Arts Complex, Kevin Taylorʼs at the Opera House serves pre-theater cocktails and dinner on evenings with performances in the Ellie Caulkins Opera House, Buell Theater and/or Boettcher Concert Hall. The Holm Social event will be held in the Chambers-Grant Salon, an extraordinary 11,600 sq. ft. space featuring twinkling fiber optic ceilings, exposed stone walls, full stage and luxurious finishes. Each conference attendee will receive a ticket to attend the social event on the Kevin Taylor at the Opera, Additional tickets may be purchased for the rate of $80 USD. 6

9 Holm Co nference Ragnar Hol m Scientific Achievement Award NominationGuidelines History: The Ragnar Holm Scientific Achievement Award was created by the 1971 Holm Conference Steering Committee in honor of the memory of Dr. Ragnar Holm, the founder of the modern science of electrical contacts. This award is to be granted to the living scientist or engineer who has made significant contributions to the theory or practice of electrical contacts, or for work in related technologies which is directly applicable to contacts. In considering a personʼs work and selecting a recipient preference will be given for: a.) Nominees that have made contributions to the technology over many years, b.) the originality and scientific importance of contributions, and c.) achievements that have found a high degree of practice. Provided worthy candidates are found, the Award will be granted annually. Eligibility: Any person may be nominated for this award regardless of IEEE membership. Members of IEEE Holm Awards Committee are not eligible to be considered for the award while serving on this committee. Nominations are not accepted for persons deceased. Candidates must have made contributions to the electrical contact field for a period spanning at least ten years. Nominator Eligibility: Any person may nominate a candidate for this award, with the following exception: members of the award committee. Nomination Support Materials Endorsers: At least two letters of endorsement are required. One is from the nominator and the others are from the endorsers selected by the nominator. Endorsers should be in a position to substantiate the candidateʼs contributions by providing explicit detail from personal knowledge. The nominator is responsible for submission of the letters of endorsement. Candidate Personal Data/Education/Work: Name, provide complete name of candidate, not initials. Personal, provide date of birth, and citizenship. Education, list year and exact degree of institute. Society Membership, list various professional society affiliations. Under society activities list officers and major committee work. Professional History, list present occupation followed by previous career experiences. Indicate positions held, years, and briefly explain each responsibility. Technical Accomplishments: Technical Publications, such as books, papers, reports, and standards are to be listed in chronological order giving authorʼs names, title, book, journal, or proceedings. Patents, should be listed by date, number, 7

10 title, and country of origin. Documentation authentication Development of Products or processes, may be listed for items not covered by patents. Technical Presentations, such as keynote addresses or courses developed by the candidate should also be listed. Significant Contributions: Describe the candidateʼs outstanding contributions in terms of specific items. Provide a short paragraph to each one including a general description of the item, the degree of originality and creativity, and importance of the work to the electrical contact field and the time period over which the contribution was made. Also, state cases of examples of practices which were developed or modified through contributions of the candidate. Forward Nominations To: IEEE Holm Nominations Committee, c/o IEEE Holm Conference Planner, 445 Hoes Lane, Piscataway, NJ USA 2018 Nominations Deadline: 13 January

11 The 2017 Ragnar Holm Scientific Achievement Award The Ragnar Holm Scientific Achievement Award derives its significance and prestige from the scientist whose name it carries. The contributions of Dr. Ragnar Holm to electrical contact theory and application are renowned the world over. The award, created in 1971 by the Steering Committee of the holm conference, honors the memory of the founder of modern electrical contact science by recognizing outstanding scientists and engineers in the field of electrical contacts or related technologies. An award committee appointed by the steering committee of the conference meets annually and considers nominations for the award that have been received and determines whether they have a worthy candidate. The award is not limited to candidates from the United States, or to works that have been presented to the IEEE-Holm Conference. SIEGFRIED FOUVRY Siegfried Fouvry is currently Director of Research CNRS at LTDS laboratory of Ecole Centrale de Lyon. He received his engineering undergraduate degree from the Ecole Centrale de Lyon in 1992 and his Ph.D Thesis under the direction of Prof. L. Vincent in Since 2015 he had the responsibility of the tribology research group of the LTDS laboratory. His main research work focuses on the experimental investigation and modelling of fretting damages including the quantification of the fretting sliding conditions, the analysis of local friction coefficient, the quantification of surface wear through a friction energy wear approach and the prediction of fretting cracking risk using non local fatigue modelling. A major interest of his research concerns the fretting wear damages in DC and more recently RF electrical contacts. Author of more than 130 papers and 3 patents he received the HIRN prize in 1998 and the Jean Mandel prize in 2000 (X-Ecole Polytechnique). 9

12 Holm 2018 The 28th International Conference on Electric Contacts Held in Conjunction With The 64th IEEE Holm Conference on Electrical Contacts The 29th International Conference on Electric Contacts will be held in conjunction with the 64th IEEE Holm Conference on Electrical Contacts on October 14-18, 2018, in Albuquerque, New Mexico, USA. Prior to these, the 4 d a y s Intensive Course on Electrical Contacts will be held o n October 10-13, 2018 in the same location. The course covers all aspects of the Electrical Contacts: Contact fundamentals and materials Friction, wear, fretting and lubrication Electric arc fundamentals and dynamics Power and electronic connector technologies Guidelines for electrical and electronic connector design Prospective authors should submit a brief abstract (200 words maximum) online before February 9, Authors will be notified concerning acceptance of abstracts by February 17, Please include complete contact information for all correspondence to be sent. Abstracts are to be submitted through the IEEE Conference express website: Enter conference ID holm18 (please use lower case) February 9, 2018 February 23, 2018 April 20, 2018 October 14, 2018 Important Dates Abstract Deadline Notification of Acceptance Completed Paper Deadline Conference Begins Correspondence Address IEEE Meeting & Conference Management IEEE Holm Conference (2016) 445 Hoes Lane Piscataway, NJ US and Canada: Elsewhere: Fax: holmreg@ieee.org Holm Website: 10

13 Morton Antler Lecture The Morton Antler Lecture is an annual technical presentation given at the IEEE Holm Conference on a topic of special interest to the electrical contact community. The lecture series was established in honor of Dr. Morton Antler, a longtime member of the Holm Steering Committee and participant in the Holm Conference. Dr. Antler was a distinguished scientist and lecturer in the fields of electrical contacts, tribology, corrosion, and electrodeposition. Electric Vehicles and Autonomous Driving Randy Sumner Director, Global Hybrid Vehicle Business & Technology Development Delphi Packard Electric E/EA Abstract: Hybrid and All Electric Vehicles: Some of the questions that will be discussed: What are the main driving forces for the development of electric vehicles? What are the main challenges for the expansion of this market? What are the biggest changes required for the electrical system and the components of the electrical system? What are the advantages and disadvantages between the hybrid and purely-electrical vehicles? What are the current status and plans for expansion of charging stations for pure electric? What advances have been made in battery design? Autonomous Vehicles: What is the driving force for autonomy? What is the timing on autonomy developments? What are the plans for partial and total autonomy and will total autonomy be accepted? How are vehicle electrification and autonomy converging? What are the biggest technical challenges facing development of autonomous vehicles? 11

14 Erle Shobert Prize Paper The Holm Conference Prize Paper Award was established in At that time, the Conference Steering Committee recognized that at each Conference there was at least one paper that stood out from the others in its technical content and quality of presentation. Therefore, the Prize Paper Award Committee was established. The Committeeʼs purpose is to review each paper, listen to each presentation and then judge which paper should receive the Prize Paper Award. The award is presented to the authors of the Prize Paper at the following yearʼs Holm Conference. Erle 2016 IEEE Erle Shobert Prize Paper Impact of the Gas Environment on the Electric Arc Daniel Grogg and Clemens Schrank, TE Connectivity USA Paul and D ee Dee Slade Young Investigator The Paul and Dee Dee Slade Young Investigator Award was established in 2011 with the objective to recognize outstanding achievement of young investigators in the field of Electrical Contacts and to encourage young scientists and engineers to enter this field. To be eligible for the Award, the candidate must be under the age of 35 as of the closing date of the conference, and present a paper at the conference in which s/he is either the sole author or the first author of a multi-author paper. The award is presented at the conference awards luncheon and will be prominently mentioned in the proceedings of the following conference. Erle 2016 Paul and D ee Dee Slade Young Investigator Award Stress-dependent Frequency Response of Conductive Granular Materials Chongpu Zhai, Dorian Hanaor, Gwénaëlle Proust and Yixiang Gan, The University of Sydney 12

15 rters of The 63 rd IEEE Holm Conference on ElectricalContacts Platinum Level Checon Corporation Heraeus Materials Technology GmbH & Co. Hindustan Platinum Pvt. Ltd. Shanghai Hiwave Precision Instrument Co.,Ltd Gold Level Doduco Electrical Contacts Plus, LLC NAECO Tanaka Precious Metals TE Connectivity Umicore Technical Materials Silver Level Metalor Technologies USA NN, Inc. Precision Engineering Product Group Bronze Level Deringer-Ney, Inc. Eaton Corporation Molex 13

16 WITH COOPERATION FROM ABB, Switzerland Auburn University Austrian Institute of Technology Beihang University Beijing University of Posts and Telecommunications CentraleSupélec-Université Paris-Saclay Chitose Institute of Science & Technology Chixi Technology Co., Ltd. College of Safety Science and Engineering Delphie, USA Doduco Contacts and Refining Eaton Corporation Esterline Power Systems Florida State University Friedrich-Alexander-University Fuda Alloy Materials Co., Ltd. Fuji Electric FA Components & Systems G&A Electronics Co., Ltd. Harbin Institute of Technology Hydro Québec IREQ Hyundai Technologies Centre, Hungary Intel Corporation Jiangsu University of Science and Technology Karlsruhe Institute of Technology Kazakh-British Technical University Kazakstan Institute of Mathematics and Mathematical Modeling Keio University Laboratoire GeePs, France Liaoning Technical University Lucy Electric (India) Lucy Electric (UK) Max-Planck-Institut für Eisenforschung Mitsubishi Materials Corporation Moog Components Group National Institute of Advanced Industrial Science and Technology Nippon Institute of Technology Ostwestfalen-Lippe University of Applied Sciences Panasonic Corporation Japan Paul G. Slade, Consultant Plansee Powertech AG RD Malucci Consulting Schneider Electric, China Schneider Electric, USA Shandong Alfa Dachi Electric Co, Ltd. Shanghai Hiwave Composite Materials Company Shanghai Jiao Tong University Siemens, Germany Siemens, Mexico Siemens, USA State Grid Liaoning Electric Power Supply Co., Ltd. TE Connectivity, Belgium TE Connectivity, Germany TE Connectivity, USA Technische Universität Darmstadt Technische Universität Dresden Tokyo Institute of Technology Umicore Technical Materials AG & Co. University de Lorraine University of Southampton, Malaysia University of Southampton, UK Weibin Ye, Keysight Technologies Co., Ltd. Yazaki Parts Co., Ltd. 14

17 MONDAY, 11 September :00AM INTRODUCTION AND OPENING REMARKS Rod Martens, 2017 IEEE Holm Conference Chair 8:10AM 9:10AM HOLM AWARDEE CHAIR: SOPHIE NOËL Technical Program 9:10AM 9:25AM BREAK 9:25AM 11:05AM YOUNG INVESTIGATOR SESSION CHAIR: ROBERT JACKSON CO-CHAIR: DAVID WILLIAMS 1.1 Study of the Electric Arc in DC Contactors: Modelling, Simulation and Experimental Validation Marc. Buffo, University of Lorraine; Jean-Philippe Martin, University of Lorraine; Shahrokh Saadate, University of Lorraine; Jonathan Andrea, Esterline Power Systems; Nicolas Dumoulin, Esterline Power Systems; Éric Guillard, Esterline Power Systems 1.2 Effect of fretting wear of connectors regarding phase noise of RF signal: influence of sliding amplitude and gold coating thickness Richard Enquebecq, Ecole Centrale de Lyon, France; Olivier Graton, Ecole Centrale de Lyon; France; Siegfried Fouvry, Ecole Centrale de Lyon; France; Enrico Rubiola, Femto-ST; France; Manuel Collet, Femto-ST, France; Laurent Petit, Femto-ST, France; Julien Legrand, Femto-ST, France 1.3 Multi-physics Modeling and Au-Ni/Rh Coating Assessment for ITER Ion Cyclotron Resonance Heating Radio-Frequency Sliding Contacts Zhaoxi Chen, IRFM, France; Julien Hillairet, IRFM, France; Viviane Turq, CIRIMAT, France; Yuntao SONG, Institute of Plasma Physics, China; Raphaël laloo, CIRIMAT, France; Karl Vulliez, DEN/DTEC/SDTC, France, Jean-Michel Bernard, IRFM, France; Qingxi Yang, Institute of Plasma Physics, China; Gilles Lombard, IRFM, France; Caroline Hernandez, IRFM, France, Leonel Ferreira, CERN Switzerland; Florent Fesquet, CERN Switzerland; Patrick Mollard, IRFM, France; Robert Volpe IRFM, France; and Fabien Ferlay IRFM, France 15

18 1.4 Study on Molten Bridge Behaviors with Arc-less Current Commutation in a Hybrid DC Circuit Breaker Mo. Chen, Tokyo Institute of Technology, Japan ; Yuta Yamada, Tokyo Institute of Technology, Japan; Shungo. Zen, Tokyo Institute of Technology, Japan; Koichi Yasuoka, Tokyo Institute of Technology, Japan 1.5 The Impact of Short Circuits on Contact Elements in High Power Applications Toni Israel, Technische Universität Dresden, Germany; Michael Gatzsche, Technische Universität Dresden, Germany; Stephan Schlegel, Technische Universität Dresden, Germany; Steffen Großmann, Technische Universität Dresden, Germany; Tom Kufner, Stäubli Electrical Connectors AG, Switzerland and George Freudiger, Stäubli Electrical Connectors AG, Switzerland 11:05AM 11:20AM BREAK 11:20AM 12:20PM Modelling I CHAIR: ROBERT JACKSON CO-CHAIR: KARUMBU MEYYAPPAN 2.1 Comparison of spherical and axisymmetric models of electrical contact heating and the conditions of their application Stanislav Kharin, Kazakh- British Technical University, Almaty, Kazakhstan 2.2 Research on the distribution thermal FEM model for an enclosed isolated phase bus-bar in short-circuit condition Huimin Liang, Harbin institute of Technology, China; Ruichao Wang, Harbin institute of Technology, China; Jiaxin You, Harbin institute of Technology, China; Longxing Bao, Shandong Alfa Dachi Electric Co., China and Hongjian Wang, Shandong Alfa Dachi Electric Co., China 2.3 The Impact on Current Density and Constriction resistance from Bridge Structures in Real contacts Robert Malucci, RD Malucci Consulting, USA 12:20PM 13:40PM Lunch (on your own) 16

19 13:40PM 15:00PM Arcing Contacts I CHAIR: PAUL SLADE CO-CHAIR: VOLKER BEHRENS 3.1 Preliminary Study on on Switching Characteristics of Silver Tin Oxide Type Contacts for for Capacitive Load Wanbin Ren, Harbin Institute of of Technology, China; China; Jianmin Wei, Harbin Institute of of Technology, China; China; Xu Xu Zhang, Harbin Institute of of Technology, China; China; Fubiao Fubiao Luo, Luo, G&A Electronics Ltd. Co, Co, China; Zhefeng Zhou, Zhou, G&A G&A Electronics Ltd. Co, China;and Yinghua Fu, Fu, Chixi Chixi Technology Co., China 3.2 Applications of of Laser Arc Arc Image System on on Imaging the Arcing Behavior of of Electrical Contacts Hai Chen, Siemens Industry, Inc., Inc., Atlanta, USA USA 3.3 Study of the Influence of of Permanent Magnets in the Interruption Process of the of the Electrical Arc in in MCCB Eugenio Galvan, Siemens, S. S. A. A. de de C.V., C.V., Mexico Mexico and and Juan Jose Rodriguez Siemens, S. S. A. A. de de C.V., C.V., Mexico Mexico 3.4 Measuring Arc Temperature Distribution and Its Time-evolution Based on on Relative Intensity Method Xue Zhou, Harbin Institute of of Technology, China; China; Harbin Harbin Yong Zhang, Harbin Institute of of Technology, China China and and Guofu Zhai, Harbin Institute of of Technology, China China 15:00PM 15:15PM BREAK 15:15PM 16:55PM FRETTING CHAIR: BRETT RECKITT CO-CHAIR: GEORGE DREW 4.1 High Frequency Signal Transmission across Contact Interface Subjected to to Vibration Induced Fretting Corrosion Haoyue Yang, Auburn University, USA; USA; Thomas Stegeman, Florida State University, USA; Rui Ji, Beijing University of of Posts Posts and and Telecommunications, China; Michael Hamilton, Auburn University, USA; USA; Jinchun Gao, Beijing University of of Posts and and Telecommunications, China and and George Flowers, Auburn University, USA USA 4.2 Fretting in sliding electrical contacts Glenn Dorsey, Moog Components Group, USA USA 17

20 4.3 Reliability Test Induced failures vs vs Field Field Performance: Contact Fretting perspective Karumbu Meyyappan, Intel Corporation, USA; USA; QiFeng Wu, Intel Corporation, USA; Milena Vujosevic, Intel Intel Corporation, USA; Charles Hill, Hill, Intel Intel Corporation, USA USA and Ryan Parrott, Intel Corporation, USA USA 4.4 Fretting behaviour of of connectors under grease lubrication Sophie Noël, CentraleSupélec, LGEP, France; Aurore Brezard-Oudot, CentraleSupélec, LGEP, France; Pascal Chretien, CentraleSupélec, LGEP, France; and David Alamarguy, CentraleSupélec, LGEP, France 4.5 Third bodies in in electrical contacts Friction, wear and electrical performance Jian Song, Ostwestfalen-Lippe University of of Applied Sciences, Germany; Haomiao Yuan, Ostwestfalen-Lippe University of of Applied Sciences, Germany and and Vitali Vitali Schinow, Ostwestfalen-Lippe University of of Applied Sciences, Germany 6:00PM SOCIAL EVENT 18

21 TUESDAY, 12 SEPTEMBER :00AM 09:20AM MATERIALS I CHAIR: GEORGE DREW CO-CHAIR: SOPHIE NOËL 5.1 Exploratory Study of of Silver Nanoparticle Laden Lubricants for Electrical Contacts Robert Jackson, Auburn University, USA; Alex Alex Coker, Auburn University, USA; Zoe Tucker, Auburn University, USA; Mohammad Hossain, Auburn University, USA and German Mills, Auburn University, USA 5.2 New LITESURF Plating for the the Mitigation of of Whisker Risks in Press-Fit Applications Erika R. Crandall, TE Connectivity, Germany; Frank Frank Schabert, TE Connectivity, Germany; Helge Schmidt, TE Connectivity, Germany; Martin Bleicher, TE Connectivity, Germany; Thomas Fili, Fili, TE Connectivity, Germany; Walter E. E. Mueller - von - von Fischer, TE Connectivity, Germany; Claus Borhauer, TE Connectivity, Germany; Stefan Thoss, TE Connectivity, Germany; Jorge Villarreal, TE Connectivity, Germany and Bart Kerckhof, TE TE Connectivity, Belgium 5.3 The effect of the nickel underplate on on the the heat heat resisting properties of of silver plated copper alloy alloy contacts Kenji Kubota, Mitsubishi Materials Corporation, Japan; Kiyotaka Nakaya, Mitsubishi Materials Corporation, Japan; Takashi Tamagawa, Mitsubishi Materials Corporation, Japan; Hiroyuki Mori, Mitsubishi Materials Corporation, Japan; Toru Toru Nishimura, Mitsubishi Materials Corporation, Japan; Yoshitaka Ito, Yazaki Parts Co., Japan; Tomohiro Shimada, Yazaki Parts Co., Japan; and and Takaya Kondo, Yazaki Parts Co., Japan; 5.4 Thermomechanical Stresses within Ag/SnO2 Contact Materials after Arcing Events Timo Muetzel, Umicore Technical Materials AG AG & & Co., Germany; Duancheng Ma, Austrian Institute of of Technology, Austria; Franz Roters, Max-Planck-Institut für für Eisenforschung Germany and Dierk Raabe, Max-Planck- Institut für Eisenforschung, Germany 9:20AM 9:35AM BREAK 19

22 9:35AM 10:35AM MORTON ANTLER LECTURE Electrical Vehicles and Autonomous Driving Randy Sumner, Delphie, USA 10:35AM 10:50AM BREAK 10:50AM 12:10AM TESTING CHAIR: HENRY CZAJKOWSKI CO-CHAIR: RONALD COUTU 6.1 Investigation on on Electrical Connector Degradation in in High Frequency Using Time Time Domain Reflectometry Qingya Li, Li, Beijing University of of Posts and and Telecommunications, China; Rui Rui Ji, Ji, Beijing University of of Posts and Telecommunications, China; Jinchun Gao, Gao, Beijing University of of Posts and and Telecommunications, China; George Flowers, Auburn University, USA; USA; Gang Gang Xie, Beijing University of of Posts and and Telecommunications, China and Weibin Ye, Ye, Keysight Technologies Co., Co., Ltd., Ltd., China 6.2 Research on on the resolving power of of Ultrasonic Nondestructive Testing Technique on on the the minor minor Welding Defects on on Low - voltage - Electrical Apparatus Ye Lianhui, Shanghai Hiwave Precision Instrument Co., Co., Ltd, China; Wang Yuanzhong, Schneider Shanghai Apparatus Parts Manufacturing Co., Co., Ltd, Ltd, China; Li Benlu, Li Benlu, Schneider Shanghai Apparatus Parts Parts Manufacturing Co., Co., Ltd, China; Liu Nan, Schneider Shanghai Apparatus Parts Parts Manufacturing Co., Ltd, Ltd, China;and Qiu Qiu Kui, Kui, Shanghai Hiwave Precision Instrument Co., Co., Ltd, Ltd, China China 6.3 The Failure Mechanism of of Aerospace Electromagnetic Relay in in Accelerated Storage Degradation Testing Zhaobin Wang, Jiangsu University of of Science and and Technology, China; Zhoulin Huang, Jiangsu University of of Science and Technology, China; Jiawei Wang, Jiangsu University of of Science and and Technology, China; Shang Shang Shang, Jiangsu University of of Science and and Technology, China and Guofu Zhai, Harbin Institute of of Technology, China 20

23 6.4 Failure depending progression of of contact resistance in in thermal-shock testing of of springclip contacts Matthias Friedlein, Friedrich-Alexander-University, Germany; Michael Spahr, Friedrich-Alexander-University, Germany; Robert Sueß-Wolf, Friedrich-Alexander- University, Germany and and Joerg Franke, Friedrich- Alexander-University, Germany 12:10PM 13:30PM AWARDS LUNCHEON 13:30PM 14:50PM SLIDING CONTACTS CHAIR: ED SMITH CO-CHAIR: DANIEL GAGNON 7.1 Commutation Characteristics and and Brush Brush Wear Wear of DC Motor at at High Rotation Speeds Koichiro Sawa, Nippon Institute of of Technology, Japan; Masayuki Isato, Nippon Institute of of Technology, Japan; Takahiro Ueno, Nippon Institute of Technology, Japan; Keisuke Nakano, Panasonic Corporation, Japan and and Kenji Kondo, Panasonic Corporation, Japan 7.2 Effects of of lubricant oil oil on on sliding contact phenomena in in carbon brush-slip ring ring system Yuki Amada, Nippon Institute of of Technology, Japan; Japan; Koichiro Sawa, Nippon Institute of of Technology, Japan Japan and and Takahiro Ueno, Nippon Institute of of Technology, Japan Japan 7.3 Temperature Characteristics of of Sliding Friction Pair under High-speed and and Strong-current Conditions Zhiyong Wang, Liaoning Technical University, China; China; Fengyi Guo, Liaoning Technical University, China; China; Shuai Shuai Liu, Liaoning Technical University, China; Bilguun Baatar, Baatar, Liaoning Technical University, China; Yuting Yuting Wang, Wang, Liaoning Technical University, China; and and Haihong Liang, Liang, State Grid Liaoning Electric Power Supply Co. Co. Ltd., Ltd., China China 7.4 Current detection of of off off line line arc arc and and back back stepping control of of pantograph catenary system Zhiling Ren, Liaoning Technical University, China; China; Dong Lin, Liaoning Technical University, Chian; Chian; Ziqi Ziqi Nie, Beihang University, China and and Guangquan Zhang, Liaoning Technical University, China China 14:50PM 15:05PM BREAK 21

24 15:05PM 16:25PM ARCING II II CHAIR: JERRY WITTER CO-CHAIR: Z.K. CHEN 8.1 Influences of of external magnetic field field application and increased contact opening speeds on on break arc arc duration characteristics of AgSnO2 contacts in in DC DC load load conditions Makoto Hasegawa, Chitose Institute of Science of & & Technology, Japan and and Seika Tokumitsu, Chitose Chitose Institute Institute of of Science && Technology, Japan 8.2 Power Flux brought by by an an electric arc arc on on AG AG SnO2 electrode Philippe Testé, CentraleSupelec-UPMC-UPSud, France; Romaric Landfried CentraleSupelec-UPMC- UPSud, France and and Frédéric Houzé, CentraleSupelec-UPMC-UPSud, France 8.3 Influence of of Contact Materials and and Opening Velocity on on Various Characteristics of DC of DC High High Voltage Arc Kiyoshi Yoshida, Nippon Institute of Technology, of Japan; Japan; Koichiro Sawa, Nippon Institute of Technology of and and Keio Keio University, Japan; Kenji Suzuki, Fuji Fuji Electric FA FA Components && Systems Co., Co., Ltd, Ltd, Japan Japan and and Koetsu Koetsu Takaya, Fuji Electric FA FA Components & Systems & Co., Co., Ltd, Ltd, Japan 8.4 Application of of a a New Ag/SnO2 Contact Material in AC-Contactors Havva Cinaroglu, R&D Contacts, DODUCO Contacts and and Refining, Germany; Volker Behrens, R&D R&D Contacts, DODUCO Contacts and and Refining, Germany and and Thomas Thomas Honig, R&D Contacts, DODUCO Contacts and and Refining, Germany 16:30PM TC1 MEETING CHAIR: GERRY WITTER 22

25 8:00AM 9:00AM WEDNESDAY, SEPTEMBER MATERIALS II II CHAIR: ROLAND TIMSIT CO-CHAIR: HÉLÈNE GAUTHIER 9.1 Investigation On On The Electrical Properties Of Of AgNi Contact Material With Various Ni Ni Content Heng Wang, Fuda Alloy Materials Co., Co., Ltd, Ltd, China China and and Huan Yuan, Fuda Alloy Materials Co., Co., Ltd, Ltd, China China 9.2 In-situ Synthesized Silver-Graphene Nanocomposite with Enhanced Electrical and and Mechanical Properties for for High-Performance Contact Materials Pengpeng Wang, Shanghai Hiwave Composite Materials Company, China; Zhijun Wei, Wei, Shanghai Hiwave Composite Materials Company, China; Minhua Shen, Shanghai Hiwave Composite Materials Company, China; Hui Hui Pan, Shanghai Jiao Jiao Tong Tong University, China; Jun Jun Fu, Fu, Schneider Electric Co., Co., Ltd., Ltd., Shanghai, China and Lesheng Chen, Shanghai Hiwave Composite Materials Company, China China 9.3 The influence of of multi-scale roughness on the contact mechanics of of a Au a Au coated CNT composite for for low low current switching Hong Liu, University of of Southampton Malaysia Campus, Malaysia and and John John McBride, University of of Southampton, UK UK 9:00AM 9:15AM BREAK 9:15AM 10:55AM SWITCHING // VACUUM INTERRUPTERS CHAIR: TIMO MUETZEL CO-CHAIR: XIN ZHOU 10.1 Influence of of Sealed Gas and and Pressure on on Arc Arc Discharge of of Electromagnetic Contactor Kiyoshi Yoshida, Nippon Institute of of Technology, Japan; Japan; Koichiro Sawa, Nippon Institute of of Technology and and Keio Keio University, Japan; Kenji Suzuki, Fuji Fuji Electric FA FA Components && Systems Co., Co., Ltd, Ltd, Japan and and Koetsu Takaya, Fuji Electric FA FA Components & Systems & Co., Co., Ltd, Ltd, Japan 23

26 10.2 Investigation of Arc Splitters in an SF6 Insulated Medium Voltage Switchgear Balazs Novak, Lucy Electric, New Product Development, UK; Rahul Sonar, Lucy Electric India Excellence Centre, India and Ramesh Sivaraj, Lucy Electric India Excellence Centre, India 10.3 Development of an Arcless DC Circuit Break using a Mechanical Contact and a Semiconductor Device Shungo Zen, Tokyo Institute of Technology, Japan; Tatsuya Hayakawa, Tokyo Institute of Technology, Japan; Kyotaro Nakayama, Tokyo Institute of Technology, Japan and Koichi Yasuoka, Tokyo Institute of Technology, Japan 10.4 Effect of the axial magnetic field structure on the threshold welding current for closed, axial magnetic field, vacuum interrupter contacts Paul G. Slade, Consultant USA; Erik D. Taylor, Siemens, Germany and Andreas Lawall, Siemens Germany 10.5 Interdependency of Test Environment and Current Breaking Capacity of a Model Vacuum Switch Alexander Feilbach, Technische Universität Darmstadt, Germany; Henrik Menne, Technische Universität Darmstadt, Germany; Volker Hinrichsen, Technische Universität Darmstadt, Germany; Ulla Hauf, Karlsruhe Institute of Technology, Germany; Martin Heilmaier, Karlsruhe Institute of Technology, Germany; Mike Böning, Plansee Powertech AG, Switzerland and Frank Müller, Plansee Powertech AG, Switzerland 10:55AM 11:10AM BREAK 11:10AM 12:10PM CONNECTORS CHAIR: MARJORIE MYERS CO-CHAIR: DAVID WILLIAMS 11.1 Glowing Connections in DC Circuits John Shea, Schneider-Electric, USA 11.2 Press- and shrink-fit connections with cylindrical aluminum conductors for high-current applications contact and long-term behavior depending on mechanical parameters Alexander Ramonat, Technische Universität Dresden, Germany; Stephan Schlegel, Technische Universität Dresden, Germany; Steffen Großmann, Technische Universität Dresdenn, Germany and Matthias Kudoke, High Voltage Products ABB, Switzerland 24

27 11.3 Temperature Rise of Canted Spring Contacts During Fault Current Balazs Novak, Department of New Product Development, Lucy Electric, UK and Laszlo Szabo, Hyundai Technologies Centre, Hungary 12:10PM 13:20PM Lunch (on your own) 13:20PM 14:20PM MODELLING CHAIR: Bob MALUCCI CO-CHAIR: DANIEL GAGNON 12.1 Experimental verification/comparison between standard sphere against flat and a new wave structured contact surface topography developed using a numerical contact model; Michael Leidner, TE Connectivity, Germany; Helge Schmidt, TE Connectivity, Germany; Marjorie Myers, TE Connectivity, USA; Stefan Thoss, TE Connectivity, Germany; Svenja Stotz, TE Connectivity, Germany and Matthias Brunner, TE Connectivity, Germany 12.2 The role of the arc heat flux and Joule heating in the erosion of electrical contacts Stanislav Kharin, Kazakh-British Technical University, Kazakhstan and Merey Sarsengeldin, Institute of Mathematics and Mathematical Modeling, Kazakhstan 12.3 The effect of the distribution of A-spots in the peripheral part of an apparent contact point on constriction resistance Yasuhiro Fukuyama, National Institute of Advanced Industrial Science and Technology (AIST), Japan; Norihiko Sakamoto, National Institute of Advanced Industrial Science and Technology (AIST), Japan; Nobu-Hisa Kaneko, National Institute of Advanced Industrial Science and Technology (AIST), Japan; Takaya Kondo, Yazaki Parts CO., LTD, Japan; Jun Toyoizumi, Japan and Takahiro Yudate, Yazaki Parts CO., LTD, Japan 14:20PM 14:35PM BREAK 25

28 14:35PM 15:55PM SAFETY AFCI CHAIR: XIN ZHOU CO-CHAIR: GUANG YANG 13.1 Feature Analysis in Time-domain and Fault Diagnosis of Series Arc Fault Yanli Liu, Liaoning Technical University and College of Safety Science and Engineering, China; Fengyi Guo, Liaoning Technical University, China; Zhiling Ren, Liaoning Technical University, China; Peilong Wang, Liaoning Technical University, China; Tuan Nghia Nguyen, Liaoning Technical University, China;; Jia Zheng, Liaoning Technical University, China and Xirui Zhang, Liaoning Technical University, China 13.2 A serial Arc Fault Location algorithm based on impedance method for a domestic AC system Edwin Calderon, University de Lorraine, Institut Jean Lamour, France; Patrick Schweitzer, University de Lorraine, Institut Jean Lamour, France and Serge Weber, University de Lorraine, Institut Jean Lamour, France 13.3 Arcing Fault in Aircraft Distribution Network Jonathan Andrea, Esterline Power Systems, R&D, France; Marc Buffo, Esterline Power Systems, R&D, France; Eric Guillard, Esterline Power Systems, R&D, France; Romaric Landfried, Laboratoire GeePs, Univ. Paris-Saclay, France; Redouane Boukadoum, Laboratoire GeePs, Univ. Paris-Saclay, France and Philippe Testé, Laboratoire GeePs, Univ. Paris- Saclay, France 13.4 Research on Feature of Series Arc Fault Based on Improved SVD Hongxin Gao, Liaoning Technical University, China; Xili Wang, Liaoning Technical University, China; Tuan Nghia Nguyen, Liaoning Technical University, China; Fengyi Guo, Liaoning Technical University, China; Zhiyong Wang, Liaoning Technical University, China; Jianglong You, Liaoning Technical University, China and Yong Deng, Liaoning Technical University, China 15:55PM CLOSING REMARKS ROD MARTENS 26

29 Author Alamarguy, David 18 Amada, Yuki 21 Andrea, Jonathan 15,26 Baatar, Bilguun 21 Bao, Longxing 16 Behrens, Volker 22 Benlu, Li 20 Bernard, Jean-Michel 15 Bleicher, Martin 19 Böning, Mike 24 Borhauer, Claus 19 Boukadoum, Redouane 26 Brezard-Oudot, Aurore 18 Brunner, Matthias 25 Buffo, Marc 15,26 Calderon, Edwin 26 Chen, Hai 17 Chen, Lesheng 23 Chen, Mo 16 Chen, Zhaoxi 15 Chretien, Pascal 18 Cinaroglu, Havva 22 Coker, Alex 19 Collet, Manuel 15 Crandall, Erika R. 19 Deng, Yong 26 Dong, Lin 21 Dorsey, Glenn 17 Dumoulin, Nicolas 15 Enquebecq, Richard 15 Feilbach, Alexander 24 Ferlay, Fabien 15 Ferreira, Leonel 15 Fesquet, Florent 15 Flowers, George 17,20 Fouvry, Siegfried 9,15 Franke, Joerg 21 Index Freudiger, George 16 Friedlein, Matthias 21 Fu, Yinghua 17 Fukuyama, Yasuhiro 25 Galvan, Eugenio 17 Gao, Hongxin 26 Gao, Jinchun 17,20 Gatzsche, Michael 16 Graton, Olivier 15 Großmann, Steffen 16,24 Guangquan, Zhang 21 Guillard, Éric 16,27 Guo, Fengyi 12,26 Hamilton, Michael 17 Hasegawa, Makoto 22 Hauf, Ulla 24 Hayakawa, Tatsuya 24 Heilmaier, Martin 24 Hernandez, Caroline 15 Hill, Charles 18 Hillairet, Julien 15 Hinrichsen, Volker 24 Honig, Thomas 22 Hossain, effen Mohammad 16,24 19 Houzé, Frédéric 22 Huang, Zhoulin 20 Isato, Masayuki 21 Israel, Toni 16 Ito, Yoshitaka 19 Jackson, Robert 19 Ji, Rui 17,20 Kaneko, Nobu-Hisa 25 Kerckhof, Bart 19 Kharin, Stanislav 16,25 Kondo, Kenji 21 27

30 Kondo, Takaya 0 20, 26 Parrott, Ryan 18 Kubota, Kenji 19 Petit, Laurent 15 Kudoke, Matthias 24 Kufner, Tom 16 Raabe, Dierk 19 Kui, Qui 20 Ramonat, Alexander 24 Ren, Wanbin 17 laloo, Raphaël 15 Ren, Zhiling 21,26 Landfried, Romaric 22,26 Rodriguez, Juan Jose 17 Legrand, Julien 15 Roters, Franz 19 Leidner, Michael 25 Rubiola, Enrico 15 Li, Qinya 20 Liang, Haihong 21 Saadate, Shahrokh 15 Liang, Huimin 16 Sakamoto, Norihiko 25 Lianhui, Ye 20 Sarsengeldin, Merey 25 Liu, Hong 23 Sawa, Koichiro 22(2), 23,24 Liu, Shuai 21 Schabert, Frank 19 Liu, Yanli 27 Schinow, Vitali 18 Lombard, Gilles 15 Schlegel, Stephan 16,24 Luo, Fubiao 17 Schmidt, Helge 19,25 Schweitzer, Patrick 26 Ma, Duancheng 19 Shang, Shang 20 Malucci, Robert 16 Shea, John 24 Martin, Jean-Philippe 15 Shimada, Tomohiro 19 McBride, John 23 Sivaraj, Ramesh 24 Menne, Henrik 24 Slade, Paul 24 Meyyappan, Sonar, Rahul 24 Karumbu 18 Song, Jian 18 Mills, German 19 Song, Yuntao 15 Mollard, Patrick 15 Spahr, Michael 21 Mori, Hiroyuki 19 Stegeman, Thomas 17 Mueller von Fischer, Stotz, Svenja 25 Walter, 19 Sueß-Wolf, Robert 21 Muetzel, Timo 19 Suzuki, Kenji 22,2 Müller, Frank 19 Szabo, Laszlo 25 Myers, Marjorie 25 Takaya, Koetsu 22,23 Nakano, Keisuke 21 Tamagawa, Takashi 19 Nakaya, Kiyotaka 19 Testé, Philippe 22,26 Nakayama, Kyotaro 24 Thoss, Stefan 19,25 Nan, Liu 20 Tokumitsu, Seika 22 Nguyen, Tuan Nghia 26 (2) Toyoizumi, Jun 25 Nishimura, Toru 19 Tucker, Zoe 19 Noël, Sophie 18 Turq, Viviane 15 Novak, Balazs 24,25 Ueno, Takahiro 21(2) 28

31 Villarreal, Jorge 19 Volpe, Robert 15 Vulliez, Karl 15 Wang, Heng 23 Wang, Hongjian 16 Wang, Jiawei 20 Wang, Peilong 26 Wang, Ruichao 16 Wang, Xili 26 Wang, Yuting 21 Wang, Zhaobin 20 Wang, Zhiyong 21,26 Weber, Serge 26 Wei, Jianmin 17 Wu, QiFeng 18 Xie, Gang 20 Yamada, Yuta 16 Yang, Haoyue 17 Yang, Qingxi 15 Yasuoka, Koichi 16,24 Ye, Weibin 20 Yoshida, Kiyoshi 22,23 You, Jianglong 26 You, Jiaxin 16 Yuan, Haomiao 18 Yuan, Huan 23 Yuanzhong, Wang 20 Yudate, Takahiro 25 Zen, Shungo 16,24 Zhai, Guofu 17,20 Zhang, Xirui 26 Zhang, Xu 17 Zhang, Yong 17 Zheng, Jia 26 Zhou, Xue 17 Zhou, Zhefeng 17 Ziqi, Nie 21 29

32 IEEE HOLM CONFERENCE IEEE Meeting & Conference Management 445 Hoes Lane Piscataway, NJ VISIT US ON THE WEB AT: FIRST CLASS U.S. Postage PAID IEEE New Brunswick, NJ Permit No. 654