San Diego, CA, June 11 to 14, 2006

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1 To Advance Wafer Test Technology To Serve and Inform the Wafer Test Professional To Boldly Go Where No Workshop Has Gone Before,, 2006

2 16 th Annual SWTW IEEE SWTW Page 2

3 Informal Conference THE Conference for Wafer Test Professionals Sponsored by the IEEE Computer Society and the Test Technology Technical Council A balance mixture of semiconductor manufacturer and supplier presentations It s a Probe Technology Forum Provides practical solutions to real problems Great social activities & informal discussions Meet new people & have a little fun! IEEE SWTW Page 3

4 Who's Fault Is It? Organization and Technical Program William Mann, SWTW General Chair Jerry Broz, Ph.D., International Test Solutions, Program Chair Maddie Harwood, CEM Inc, Registration and Finance Chair Steering Committee Nadine Aldahhan, Freescale Jack Courtney, IBM Bret Crump, Micron Technologies Michael Egloff, AMD Michael Harris, Texas Instruments Ken Karklin, Agilent Technologies Ger Koch, Philips Semiconductor Rey Rincon, SV Probe Roger Sinsheimer, Xandex Tim Swettlen, Intel Fred Taber, BiTS Workshop Bill Williams, At Large IEEE SWTW Page 4

5 Silence your cell phone!!! Cell Phone Offender SWTW Cell Phone Offender SWTW IEEE SWTW Page 5

6 Sunday, June 11, 2006 Registration & Exhibits Dinner Probe Year In Review Keynote Speaker: Technical Program Mike Campbell VP Engineering Qualcomm IEEE SWTW Page 6

7 Monday, June 12 Technical Program Continental Breakfast High Volume Manufacturing Multi DUT & High Pin Methodology Lunch Pad Damage Control Exhibits Open From 3:00 t0 5:00 PM Busses to Aerospace Museum at 5:30 Tour and Buffer Dinner IEEE SWTW Page 7

8 Tuesday, June 13 Continental Breakfast Technical Program Contact Resistance Studies Large Area Probing Lunch SEMATECH Presentation Probe Metrology Panel Free Time for Networking Exhibits Open From 5:00-7:00 Team Techno Trivia after dinner IEEE SWTW Page 8

9 Technical Program Wednesday, June 14 Continental Breakfast Probe Potpourri Probe Test Data Management Best Presentation Awards Adjournment and Lunch IEEE SWTW Page 9

10 Aerospace Museum IEEE SWTW Page 10

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55 Central Online Repository Past presentations Online registration Sign up for our mailing list Tremendous continued success!! Over seventy-six thousand visits Thanks to web-efforts of Jerry Broz IEEE SWTW Page 55

56 Recognition & Awards IEEE Recognition First SWTW Life Achievement Best Overall Presentation Best Data Presented Best Presentation, Tutorial in Nature Most Inspirational Presentation Other Special Awards IEEE SWTW Page 56

57 Last Year s Winners Best Overall Presentation Comprehensive Approach to Contact Resistance Instability Joe Foerstel, Sean Chen (Altera Corporation) Atsushi Mine, Phill Mai (JEM America) Jerry Broz, Ph.D. (International Test Solutions) Best Data Presented Impact of Vibration on Contact Resistance Al Wegleitner (Texas Instruments Dallas) IEEE SWTW Page 57

58 Last Year s Winners Best Presentation, Tutorial in Nature The Probe Card Signature Syndrome Frank Pietzschmann (Infineon Technologies) Jim Andersen (Applied Precision, LLC) Most Inspirational Presentation Cobra FP Probe Card for Logic and Memory Applications Lucie Mialhe, Isabelle Garidi, Ph.D., (KNS - France) Bahadir Tunaboylu, Ph.D. (KNS - US) IEEE SWTW Page 58

59 The Special Award What A Load Of Crap! For the Poorest Disguised Sales Pitch IEEE SWTW Page 59

60 Tabletop Exhibits 1. ACCRETECH USA, INC. 2. FEINMETALL GMBH 3. ADVANCED PROBING SYSTEMS 4. SV PROBE 5. TEMPTRONIC CORPORATION 6. APEX AMERICA, INC. 7. TEST ADVANTAGE, INC. 8. MICRONICS JAPAN CO., LTD 9. INTEGRATED TECHNOLOGY CORP. 10. CASCADE MICROTECH 11. MACCS/ERS 12. POINT TECHNOLOGIES, INC. 13. INT'L TEST SOLUTIONS, INC. 14. WENTWORTH LABORATORIES, INC. 15. OXFORD LASERS, INC. 16. REID-ASHMAN MANUFACTURING 17. DYNAMIC TEST SOLUTIONS 18. RD CHEMICAL COMPANY 19. DSL LABS, INC. 20. APPLIED PRECISION, LLC 21. MICRO PROBE, INC. 22. CAMTEK USA 23. INTEST SILICON VALLEY CORP 24. JEM AMERICA CORP. 25. QUALITAU, INC. 26. AMST CO., LTD 27. ELECTROGLAS, INC. 28. FORMFACTOR, INC. 29. TOKYO ELECTRON 30. SIGMA PROBE 31. MICRO SUBSTRATES CORPORATION 32. INTEGRATED TEST CORPORATION 33. INT'L CONTACT TECHNOLOGIES IEEE SWTW Page 60

61 Products and Services Exhibition IEEE SWTW Page 61

62 Don t Get Lost! Exhibits Busses to Aerospace Conference Lunches IEEE SWTW Page 62

63 COPYRIGHT NOTICE The presentations included in the SWTW proceedings reflect the authors opinions and are presented without change. Inclusion in the proceedings does not constitute an endorsement by the SouthWest Test Workshop Committee, IEEE Computer Society or the IEEE Test Technology Council. Papers previously copyrighted or with copyright restrictions cannot be presented. In keeping with a workshop environment and to avoid copyright issues, SWTW does not officially seek a copyright ownership / transfer from authors. Authors agree by submitting their work that their presentation is original work and substantially not published previously or copyrighted, may be referenced in the work of others, will be assembled / distributed in the SWTW Proceedings, and made available for download by anyone from the SWTW website. IEEE SWTW Page 63

64 To Advance Wafer Test Technology To Serve and Inform the Wafer Test Professional To Boldly Go Where No Workshop Has Gone Before, June 5 to 8, 2005