Journal Citation Reports, Science Edition 2010: Electrical & Electronics Engineering Category, Ranked by Impact Factor

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2 Abbreviated Journal Title Publisher ISSN * 33 J LIGHTWAVE TECHNOL IEEE , IEEE T INTELL TRANSP IEEE , IEEE T SOFTWARE ENG IEEE , > IEEE PERVAS COMPUT IEEE , AUTOMATICA Pergamon-Elsevier , J MICROELECTROMECH S IEEE , IEEE T WIREL COMMUN IEEE , IET RENEW POWER GEN IET INT J ELEC POWER Elsevier , IEEE T MICROW THEORY IEEE , IEEE PHOTONIC TECH L IEEE , IEEE T POWER SYST IEEE , IEEE T AUTOMAT CONTR IEEE , > IEEE NETWORK IEEE , SENSOR ACTUAT A-PHYS Elsevier , EXPERT SYST APPL Pergamon-Elsevier , IEEE ELECTR INSUL M IEEE IEEE T NANOTECHNOL IEEE X 1, IEEE T CIRC SYST VID IEEE , IEEE T KNOWL DATA EN IEEE , IEEE IND ELECTRON M IEEE IEEE WIREL COMMUN IEEE , IEEE MICROW WIREL CO IEEE , INT J CIRC THEOR APP Wiley-Blackwell IEEE MICROW MAG IEEE IEEE T ANTENN PROPAG IEEE X 13, IEEE T INF FOREN SEC IEEE IEEE T BIOMED CIRC S IEEE J DISP TECHNOL IEEE X IEEE T AUDIO SPEECH IEEE , IEEE T COMPUT IEEE , > IEEE T CIRCUITS-I IEEE , IEEE T PARALL DISTR IEEE ,

3 Abbreviated Journal Title Publisher ISSN * 66 MICROELECTRON ENG Elsevier , IEEE CIRC SYST MAG IEEE X IMAGE VISION COMPUT Elsevier , IEEE T NUCL SCI IEEE , INT J ROBUST NONLIN Wiley-Blackwell , J FRANKLIN I Pergamon-Elsevier , IEEE T VEH TECHNOL IEEE , IEEE T DEVICE MAT RE IEEE MACH VISION APPL Springer IEEE SENS J IEEE X 2, IEEE T DIELECT EL IN IEEE , IEEE T ULTRASON FERR IEEE , IEEE T BROADCAST IEEE , SOLID STATE ELECTRON Pergamon-Elsevier , IEEE GEOSCI REMOTE S IEEE X 1, IEEE T CONTR SYST T IEEE , CONTROL ENG PRACT Pergamon-Elsevier , IEEE J OCEANIC ENG IEEE , ELECTR POW SYST RES Elsevier , J ELECTRON MATER Springer , J ELECTROMAGNET WAVE VSP , IEEE T COMMUN IEEE , INT REV ELECTR ENG-I Praise Worthy Prize SR SIGNAL PROCESS Elsevier , ENG APPL ARTIF INTEL Pergamon-Elsevier , IEEE T CIRCUITS-II IEEE , SEMICOND SCI TECH IOP Publishing , IEEE T RELIAB IEEE , > IET CONTROL THEORY A IET IEEE T ADV PACKAGING IEEE , SEMICONDUCT SEMIMET Academic Press Elsevie > J VAC SCI TECHNOL B AVS AIP , IEEE T COMPUT AID D IEEE ,

4 Abbreviated Journal Title Publisher ISSN * 99 DIGIT SIGNAL PROCESS Academic Press Elsevie , DISPLAYS Elsevier IEEE T POWER DELIVER IEEE , IEEE T IND APPL IEEE , > J MICRO-NANOLITH MEM SPIE SIGNAL PROCESS-IMAGE Elsevier IEEE VEH TECHNOL MAG IEEE COMPUT NETW Elsevier , IEEE T EDUC IEEE IEEE SIGNAL PROC LET IEEE , IET ELECTR POWER APP IET IET OPTOELECTRON IET IEEE T INSTRUM MEAS IEEE , J ELECTROSTAT Elsevier , MICROSYST TECHNOL Springer , MICROELECTRON RELIAB Pergamon-Elsevier , IEEE T MAGN IEEE , IEEE T CONSUM ELECTR IEEE , IEEE ANTENN WIREL PR IEEE , OPTO-ELECTRON REV Versita IET POWER ELECTRON IET IEEE T APPL SUPERCON IEEE , EURASIP J ADV SIG PR Hindawi , ELECTRON LETT IET , > IET COMMUN IET IEEE T COMPON PACK T IEEE , J REAL-TIME IMAGE PR Springer Heidelberg WIREL NETW Springer , IEEE DES TEST COMPUT IEEE NETWORK-COMP NEURAL Informa Healthcare X IET GENER TRANSM DIS IET MECHATRONICS Pergamon-Elsevier , J MATER SCI-MATER EL Springer ,

5 Abbreviated Journal Title Publisher ISSN * 132 IEEE T AERO ELEC SYS IEEE , > ETRI J ETRI IEEE T VLSI SYST IEEE , J NANOELECTRON OPTOE Amer Scientific Publish X MULTIMED TOOLS APPL Springer IET IMAGE PROCESS IET IEEE SPECTRUM IEEE J SOC INF DISPLAY IET IEEE ANTENN PROPAG M IEEE , ELECTROMAGNETICS Taylor & Francis OPT FIBER TECHNOL Elsevier ACM J EMERG TECH COM ACM J INFRARED MILLIM TE Springer MULTIDIM SYST SIGN P Springer COMPUT COMMUN Elsevier , EURASIP J WIREL COMM Hindawi WIREL COMMUN MOB COM Wiley-Blackwell , IEEE T ELECTROMAGN C IEEE , QUANTUM ELECTRON+ Turpion , BT TECHNOL J Springer MICROELECTRON J Elsevier , J POWER ELECTRON Korean Inst Power Elec CIRC SYST SIGNAL PR Birkhauser Boston X IEEE T SEMICONDUCT M IEEE , IET SIGNAL PROCESS IET INT J ADAPT CONTROL Wiley-Blackwell ADV ELECTR COMPUT EN Univ Suceava INT J IMAG SYST TECH Wiley-Blackwell IET MICROW ANTENNA P IET INT J OPTOMECHATRONI Taylor & Francis INT J INFRARED MILLI Springer/Plenum INTEGRATION Elsevier ELEKTRON ELEKTROTECH Kaunas Univ Technolog

6 Abbreviated Journal Title Publisher ISSN * 165 MICROW OPT TECHN LET Wiley-Blackwell , MAT SCI SEMICON PROC Elsevier BELL LABS TECH J Wiley Periodicals > SOLDER SURF MT TECH Emerald EURASIP J IMAGE VIDE Hindawi IEEE SYST J IEEE SIGNAL IMAGE VIDEO P Springer J SIGNAL PROCESS SYS Springer J ELECTRON PACKAGING ASME APPL ARTIF INTELL Taylor & Francis J SUPERCOMPUT Springer MICROPROCESS MICROSY Elsevier AEU-INT J ELECTRON C Elsevier, Urban & Fisch OPT QUANT ELECTRON Springer , J ELECTRON IMAGING IS&T & SPIE RADIOENGINEERING Spolecnost Pro Radioel INT J ANTENN PROPAG Hindawi J ELECTRON TEST Springer IET CIRC DEVICE SYST IET X RADIOPHYS QUANT EL+ Springer > IEEE IND APPL MAG IEEE COMPUT ELECTR ENG Pergamon-Elsevier INT J RF MICROW C E Wiley-Blackwell ELECTR POW COMPO SYS Taylor & Francis IEICE T ELECTRON IEICE , MICROELECTRON INT Emerald ANALOG INTEGR CIRC S Springer IET COMPUT VIS IET IEEE INSTRU MEAS MAG IEEE IEICE ELECTRON EXPR IEICE IET SCI MEAS TECHNOL IET CIRCUIT WORLD Emerald COMPEL Emerald

7 Abbreviated Journal Title Publisher ISSN * 198 IEEE TECHNOL SOC MAG IEEE MATH CONTROL SIGNAL Springer London > MICROLITHOGR WORLD Pennwell Publ X EUR T ELECTR POWER Wiley-Blackwell X IETE TECH REV IETE INT J NUMER MODEL EL Wiley-Blackwell SOLID STATE TECHNOL Pennwell Publ X > EURASIP J AUDIO SPEE Hindawi J COMMUN TECHNOL EL+ Maik Nauka/Interperio INT J APPL ELECTROM IOS Press ELECTR ENG Springer IEEJ T ELECTR ELECTR Wiley-Blackwell IEICE T COMMUN IEICE , TURK J ELECTR ENG CO Tubitak Scientific IEICE T FUND ELECTR IEICE , J ELECTR ENG-SLOVAK Slovak Univ Technology MICROWAVE J Horizon House Publicat > INTEGR FERROELECTR Taylor & Francis APPL COMPUT ELECTROM Applied Computational INT J ELECTRON Taylor & Francis > INFORM MIDEM Soc Microelectronics INT J SOFTW ENG KNOW World Scientific PRZ ELEKTROTECHNICZN Wydawnictwo Sigma FREQUENZ Fachverlag Schiele Scho INT J COMMUN SYST Wiley-Blackwell EDN Reed Business Informa J APPL RES TECHNOL Univ Nacionale Autono J CIRCUIT SYST COMP World Scientific J SYST ENG ELECTRON Systems Engineering & FUJITSU SCI TECH J Fujitsu EPE J EPE Assoc CAN J ELECT COMPUT E IEEE IEEE AERO EL SYS MAG IEEE

8 Abbreviated Journal Title Publisher ISSN * 231 INT J ELEC ENG EDUC Manchester Univ Press CHINESE J ELECTRON Technology Exchange L ELECTR ENG JPN Wiley-Blackwell AUTOMATIKA Korema SMPTE MOTION IMAG J Soc Motion Picture TV TRAIT SIGNAL Presses Univ Grenoble IETE J RES Medknow Publications MICROWAVES RF Penton Media NEC TECH J NEC INT ARAB J INF TECHN Zarka Private Univ REV ROUM SCI TECH-EL Editura Acad Romane ELECTR COMMUN JPN Wiley-Blackwell ELECTRON WORLD Nexus Media Commun LIGHT ENG Znack Publishing CONTROL ENG Reed Business Informa J I TELECOMMUN PROF ITP CONNECTOR SPECIFIER Pennwell Publ * Scores are recent additions to the Journal Citations Report. The scientist who devised the Score is Carl Bergstrom, who states at his web site "using data primarily from ISI, the source of the Science Citation (SCI) and the Thomson Reuters Journal Citation Reports (JCR),.org calculates an importance variable (called an ) for each journal. The Score is a measure of the journal's total importance to the scientific community, using an iterative algorithm to weight citations (similar to the Page algorithm used for Google.)" ** Score (AIS) is also a relatively recent addition to the IEEE JCR report. It too was developed by Bergstrom, also with data primarily from SCI and JCR. The AIS is meant to represent the relative importance of the journal on a per-article basis. Bergstrom describes the journal s Score as "a measure of the average influence of each of its articles over the first five years after publication." To find out more about the both the score and the AIS score visit the web site with FAQs at You can visit Bergstrom's academic web page at 8