Journal Citation Reports, Science Edition 2011: Electrical & Electronics Engineering Category, Ranked by Impact Factor

Transcription

1 Journal Citation Reports, Science Edition : Electrical & Electronics Engineering Category, ed by IF Abbreviated Journal Title Publisher ISSN 1 PROG QUANT ELECTRON Pergamon Elsevier P IEEE IEEE , > PROG ELECTROMAGN RES Pergamon Elsevier , IEEE T IND ELECTRON IEEE , IEEE IND ELECTRON M IEEE IEEE T PATTERN ANAL IEEE , IEEE T POWER ELECTR IEEE , IEEE T FUZZY SYST IEEE , IEEE SIGNAL PROC MAG IEEE , IEEE COMMUN MAG IEEE , IEEE J SEL TOP QUANT IEEE X 6, IEEE T MED IMAGING IEEE , IEEE T INTELL TRANSP IEEE , IEEE J SEL AREA COMM IEEE , IEEE J SOLID ST CIRC IEEE , IEEE T IMAGE PROCESS IEEE , IEEE T INFORM THEORY IEEE , J ELECTROMAGNET WAVE VSP , IEEE T NEURAL NETWOR IEEE , IEEE T GEOSCI REMOTE IEEE , IEEE J STSP IEEE , IEEE ASME T MECH IEEE , IEEE ELECTR DEVICE L IEEE , AUTOMATICA Pergamon Elsevier , J LIGHTWAVE TECHNOL IEEE , J FRANKLIN I Pergamon Elsevier , IEEE T POWER SYST IEEE , IEEE T SIGNAL PROCES IEEE X 16, IEEE T WIREL COMMUN IEEE , IEEE WIREL COMMUN IEEE , IEEE POWER ENERGY M IEEE SEMICONDUCT SEMIMET Academic Press Elsevier > IEEE PHOTONICS J IEEE IEEE T ELECTRON DEV IEEE ,

2 Abbreviated Journal Title Publisher ISSN 35 IEEE T NANOTECHNOL IEEE X 1, PATTERN RECOGN Elsevier , J DISP TECHNOL IEEE X IEEE T ENERGY CONVER IEEE , INT J ELEC POWER Elsevier , IEEE NETWORK IEEE , EXPERT SYST APPL Pergamon Elsevier , , IEEE PHOTONIC TECH L IEEE , IEEE INTELL SYST IEEE , IEEE T ANTENN PROPAG IEEE X 15, IEEE MICROW MAG IEEE IEEE T AUTOMAT CONTR IEEE , > J MICROMECH MICROENG IOP Publishing , J MICROELECTROMECH S IEEE , IEEE ACM T NETWORK IEEE , IEEE T BIOMED CIRC S IEEE IEEE T SOFTWARE ENG IEEE , > IEEE T CIRCUITS I IEEE , IEEE T VEH TECHNOL IEEE , IEEE J QUANTUM ELECT IEEE , > IEEE T MICROW THEORY IEEE , SENSOR ACTUAT A PHYS Elsevier , IEEE T CONTR SYST T IEEE , IET RENEW POWER GEN IET IMAGE VISION COMPUT Elsevier , SEMICOND SCI TECH IOP Publishing , IEEE MICROW WIREL CO IEEE , IEEE T BROADCAST IEEE , IEEE T ULTRASON FERR IEEE , IEEE T COMMUN IEEE , ENG APPL ARTIF INTEL Pergamon Elsevier , IEEE T IND APPL IEEE , > IEEE T KNOWL DATA EN IEEE , IEEE T CIRC SYST VID IEEE , INT J CIRC THEOR APP Wiley Blackwell

3 Abbreviated Journal Title Publisher ISSN 70 IET POWER ELECTRON IET IEEE GEOSCI REMOTE S IEEE X 1, MICROELECTRON ENG Elsevier , IEEE PERVAS COMPUT IEEE INT J ROBUST NONLIN Wiley Blackwell , OPT FIBER TECHNOL Elsevier IEEE T DEVICE MAT RE IEEE , NETWORK COMP NEURAL Informa Healthcare X > IEEE SENS J IEEE X 3, SIGNAL PROCESS Elsevier , IEEE T AUDIO SPEECH IEEE , CONTROL ENG PRACT Elsevier , ELECTR POW SYST RES Elsevier , J ELECTRON MATER Springer , IEEE T NUCL SCI IEEE , IEEE CIRC SYST MAG IEEE X DIGIT SIGNAL PROCESS Academic Press Elsevier , SIGNAL PROCESS IMAGE Elsevier IEEE T CIRCUITS II IEEE , IEEE T PARALL DISTR IEEE , SOLID STATE ELECTRON Pergamon Elsevier , IEEE SIGNAL PROC LET IEEE , IEEE DES TEST COMPUT IEEE IEEE ANTENN WIREL PR IEEE , IEEE T MAGN IEEE , , IEEE T POWER DELIVER IEEE , J VAC SCI TECHNOL B AVS AIP , COMPUT VIS IMAGE UND Academic Press Elsevier , IEEE T INF FOREN SEC IEEE IEEE ELECTR INSUL M IEEE IEEE T RELIAB IEEE , > IEEE T COMPUT AID D IEEE , MECHATRONICS Pergamon Elsevier , J CRYPTOL Springer > IEEE VEH TECHNOL MAG IEEE

4 Abbreviated Journal Title Publisher ISSN 105 IEEE T VLSI SYST IEEE , IEEE T INSTRUM MEAS IEEE , J COMPUT ELECTRON Springer COMPUT NETW Elsevier , IET GENER TRANSM DIS IET IEEE T ELECTROMAGN C IEEE , IET ELECTR POWER APP IET MICROELECTRON RELIAB Pergamon Elsevier , IEEE SPECTRUM IEEE IEEE T COMPUT IEEE , > IEEE T AERO ELEC SYS IEEE , > IEEE T DIELECT EL IN IEEE , J ELECTROSTAT Elsevier , J MATER SCI MATER EL Springer , COMPUT COMMUN Elsevier , IEEE T APPL SUPERCON IEEE , IET OPTOELECTRON IET IEEE T EDUC IEEE , J REAL TIME IMAGE PR Springer Heidelberg J SOC INF DISPLAY Soc Information Display MACH VISION APPL Springer J MICRO NANOLITH MEM SPIE IET CONTROL THEORY A IET IEEE T COMP PACK MAN IEEE , IEEE ANTENN PROPAG M IEEE , OPTO ELECTRON REV Versita ELECTRON LETT IET , > MULTIDIM SYST SIGN P Springer IEEE J OCEANIC ENG IEEE , IEEE T CONSUM ELECTR IEEE , MICROSYST TECHNOL Springer , IEEE SYST J IEEE MICROELECTRON J Elsevier , ELEKTRON ELEKTROTECH Kaunas Univ Technology INT J ADAPT CONTROL Wiley Blackwell

5 Abbreviated Journal Title Publisher ISSN 140 ETRI J Electronics Telecommunications Research Inst WIREL COMMUN MOB COM Wiley Blackwell , BELL LABS TECH J Wiley EURASIP J WIREL COMM Springer DISPLAYS Elsevier J POWER ELECTRON Korean Inst Power Electronics COMPUT ELECTR ENG Pergamon Elsevier QUANTUM ELECTRON+ Turpion , > IET COMMUN IET OPT QUANT ELECTRON Springer , > CIRC SYST SIGNAL PR Birkhauser Boston X EURASIP J ADV SIG PR Springer , ELECTROMAGNETICS Taylor & Francis INT J IMAG SYST TECH Wiley Blackwell APPL COMPUT ELECTROM Applied Computational Electromagnetics Soc MAT SCI SEMICON PROC Elsevier RADIOENGINEERING Spolecnost Pro Radioelektronicke In J INFRARED MILLIM TE Springer IETE TECH REV Inst Electronics Telecommunication Engineers IEEE T SEMICONDUCT M IEEE , RADIOPHYS QUANT EL+ Springer EURASIP J AUDIO SPEE Springer J ELECTRON PACKAGING ASME ELECTR POW COMPO SYS Taylor & Francis IET MICROW ANTENNA P IET J SIGNAL PROCESS SYS Springer J ELECTRON IMAGING IS&T & SPIE INTEGRATION Elsevier IEEE IND APPL MAG IEEE IET IMAGE PROCESS IET IET COMPUT VIS IET

6 Abbreviated Journal Title Publisher ISSN 171 MICROW OPT TECHN LET Wiley Blackwell , MULTIMED TOOLS APPL Springer IET SCI MEAS TECHNOL IET INT J NUMER MODEL EL Wiley Blackwell MICROELECTRON INT Emerald ANALOG INTEGR CIRC S Springer INT J RF MICROW C E Wiley Blackwell AEU INT J ELECTRON C Elsevier, Urban & Fischer J ELECTR ENG TECHNOL Korean Inst Electr Eng J SUPERCOMPUT Springer EUR T ELECTR POWER Wiley Blackwell X MICROPROCESS MICROSY Elsevier IET SIGNAL PROCESS IET SIGNAL IMAGE VIDEO P Springer London INT J OPTOMECHATRONI Taylor & Francis J NANOELECTRON OPTOE Amer Scientific Publishers X ADV ELECTR COMPUT EN Univ Suceava IET CIRC DEVICE SYST IET X J SEMICOND TECH SCI IEEK Publication Center WIREL NETW Springer , EURASIP J IMAGE VIDE Springer MATH CONTROL SIGNAL Springer London > INT J ANTENN PROPAG Hindawi J ELECTRON TEST Springer IEICE ELECTRON EXPR IEICE CIRCUIT WORLD Emerald INT J ELECTRON Taylor & Francis > ACM J EMERG TECH COM ACM IEEE INSTRU MEAS MAG IEEE INT J COMMUN SYST Wiley Blackwell IEICE T ELECTRON IEICE , ELECTR ENG Springer J COMMUN TECHNOL EL+ Maik Nauka/Interperiodica/Springer

7 Abbreviated Journal Title Publisher ISSN 204 J ELECTR ENG SLOVAK Slovak Univ Technology IEEJ T ELECTR ELECTR Wiley Blackwell IEEE LAT AM T IEEE EPE J EPE Assoc APPL ARTIF INTELL Taylor & Francis SOLDER SURF MT TECH Emerald IEEE TECHNOL SOC MAG IEEE COMPEL Emerald INTEGR FERROELECTR Taylor & Francis IEEE AERO EL SYS MAG IEEE INFORM MIDEM Soc Microelectronics, Electron Components Materials MIDEM TURK J ELECTR ENG CO Tubitak Scientific & Research Council J CIRCUIT SYST COMP World Scientific J SYST ENG ELECTRON Systems Engineering & Electronics SOLID STATE TECHNOL Pennwell Publ X > IEICE T COMMUN IEICE , PRZ ELEKTROTECHNICZN Wydawnictwo Sigma CAN J ELECT COMPUT E IEEE IEICE T FUND ELECTR IEICE , AUTOMATIKA Korema IETE J RES Medknow Publications EDN Canon Communications CHINESE J ELECTRON Technology Exchange Limited Hong Kong J APPL RES TECHNOL Univ Nacional Autonoma Mexico MICROWAVE J Horizon House SMPTE MOTION IMAG J Soc Motion Picture TV Eng REV ROUM SCI TECH EL Editura Acad Romane INT J SOFTW ENG KNOW World Scientific INT ARAB J INF TECHN Zarka Private Univ FREQUENZ Walter de Gruyter INT J APPL ELECTROM IOS Press

8 Abbreviated Journal Title Publisher ISSN 235 INT J ELEC ENG EDUC Manchester Univ Press FUJITSU SCI TECH J Fujitsu J I TELECOMMUN PROF ITP Inst Telecommunications Professionals NEC TECH J NEC MICROWAVES RF Penton Media ELECTR ENG JPN Wiley Blackwell LIGHT ENG Znack Publishing ELECTR COMMUN JPN Wiley Blackwell > TRAIT SIGNAL Presses Univ Grenoble ELECTRON WORLD St John Patrick Publ * Scores are recent additions to the Journal Citations Report. Carl Bergstrom, who devised the Score, describes it as a variable based on data from ISI, the source of the Science Citation (SCI) and the Thomson Reuters Journal Citation Reports (JCR). It is "a measure of the journal's total importance to the scientific community, using an iterative algorithm to weight citations (similar to the Page algorithm used for Google.)" ** Score (AIS), also developed by Bergstrom, is meant to represent the relative importance of the journal on a per article basis. Bergstrom describes the journal s Score as "a measure of the average influence of each of its articles over the first five years after publication." To find out more about both the score and the AIS score visit the web site